A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures-Reference-Cited by-同舟云学术

A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures

Published:1997-09 Issue:1-4 Volume:18 Page:29-37
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Paton Eric¹,Brazier Mark¹,Mansour Said¹,Bement Arden¹

Affiliation:

1. a Purdue University , 1289 Materials Science and Electrical Engineering, West Lafayette, IN, 47906, USA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589708221683

Reference13 articles.

1. Temperature dependent fatigue rates in thin-film ferroelectric capacitors

2. Electronic domain pinning in Pb(Zr,Ti)O3thin films and its role in fatigue

3. Space Charge Effect in Lead Zirconate Titanate Ceramics Caused by the Addition of Impurities

4. Role of Oxygen Vacancies on the Ferroelectric Properties of Pzt Thin Films

5. Defect chemistry and transport properties of Pb(Zr1/2Ti1/2)O3

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