Analytical Surface Potential Modelling-Based Small Signal Analysis and RF Performance Characterization of DMG SOI MOSFET for Better RFIC Application-Reference-Cited by-同舟云学术

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Analytical Surface Potential Modelling-Based Small Signal Analysis and RF Performance Characterization of DMG SOI MOSFET for Better RFIC Application

Published:2017-02-08 Issue:3 Volume:35 Page:282-291
ISSN:0256-4602
Container-title:IETE Technical Review
language:en
Short-container-title:IETE Technical Review

Author:

Malakar Tiya Dey¹,Bhattacharyya Partha²,Sarkar Subir Kumar³

Affiliation:

1. Department of Electronics & Communication Engineering, RCCIIT , Kolkata 15, India.

2. Department of Electronics & Telecommunication Engineering, IIEST , Shibpur, Howrah, India

3. Department of Electronics & Telecommunication Engineering, Jadavpur University , Kolkata 32, India

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/02564602.2017.1283252

Reference31 articles.

1. “The international technology roadmap for semiconductor,” Emerg. Res. Devices , 2009.

2. Silicon-on-Insulator Technology: Materials to VLSI

3. The Physics and Modeling of Mosfets

4. Theory of Modern Electronic Semiconductor Devices

5. SOI technology for the GHz era

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1. Design and Analysis of Nanosheet Field-Effect Transistor for High-Speed Switching Applications;Journal of Nanomaterials;2023-07-24

2. Design and Analysis of 18 nm FinFET Device with High Density Meshing for High-speed and Ultra-low Power Applications;Silicon;2022-05-05

3. Study of device parameters for work function engineered gate recessed S/D SOI MOSFET incorporating quantum mechanical effects;Microsystem Technologies;2018-04-20

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