Calculation of the electron-beam-induced current (EBIC) at a Schottky contact and comparison with Au/n-Ge diodes
Author:
Affiliation:
1. a Laboratoire de Physique des Matériaux, C.N.R.S. , 92195 , Meudon , France
2. b Laboratoire de Physique du Solide , Université de Constantine , Algeria
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642818908220175
Reference23 articles.
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3. Advances in the electrical assessment of semiconductors using the scanning electron microscope
4. Thèse Docteur Ingénieur;Dianteil C.,1983
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