Evaluation of diffusion-recombination parameters in electrodeposited CuIn(S, Se)2 solar cells by means of electron beam induced current experiments and modelling
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference11 articles.
1. Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers
2. Depth dependent collection functions in thin film chalcopyrite solar cells
3. Characterization of the CdS/Cu(In,Ga)Se2 interface by electron beam induced currents
4. Effective diffusion length of multicrystalline solar cells
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1. Electron Microscopy on Thin Films for Solar Cells;Advanced Characterization Techniques for Thin Film Solar Cells;2016-07-22
2. Formation of CuIn(1-x)GaxSe2(CIGS) by Electrochemical Atomic Layer Deposition (ALD);Journal of The Electrochemical Society;2014
3. Numerical simulation of cross section electron-beam induced current in thin-film solar-cells for low and high injection conditions;Journal of Applied Physics;2013-10-07
4. Three-dimensional simulation of electron beam induced current collected by a nano-contact: Diffusion and collection analysis;Journal of Applied Physics;2011-12-15
5. Electron Microscopy on Thin Films for Solar Cells;Advanced Characterization Techniques for Thin Film Solar Cells;2011-04-07
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