Changing the Excess Lead Oxide Content in Thin PZT Films with Increasing Annealing Temperature-Reference-Cited by-同舟云学术

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Changing the Excess Lead Oxide Content in Thin PZT Films with Increasing Annealing Temperature

Published:2015-03-12 Issue:1 Volume:477 Page:103-111
ISSN:0015-0193
Container-title:Ferroelectrics
language:en
Short-container-title:Ferroelectrics

Author:

Senkevich S. V.,Flegontova E. Yu.,Kaptelov E. Yu.,Kanareykin A. G.,Pronin V. P.,Sergeeva O. N.,Pronin I. P.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/00150193.2015.1000120

Reference20 articles.

1. Ferroelectric thin films prepared by sol-gel processing

2. Ferroelectrics, microsystems and nanotechnology

3. Microelectromechanical systems based on ferroelectric thin films

4. Processing, Structure, Properties, and Applications of PZT Thin Films

5. Thin Film Piezoelectrics for MEMS

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The change in the phase state of thin PZT layers in the region of the morphotropic phase boundary obtained by the RF magnetron sputtering with varying target-substrate distance;IOP Conference Series: Materials Science and Engineering;2018-07

2. Peculiarities of C-V characteristics of PZT films depending on annealing temperature;Ferroelectrics;2017-02-17

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