Processing, Structure, Properties, and Applications of PZT Thin Films-Reference-Cited by-同舟云学术

Processing, Structure, Properties, and Applications of PZT Thin Films

Published:2007-12-04 Issue:3-4 Volume:32 Page:111-202
ISSN:1040-8436
Container-title:Critical Reviews in Solid State and Materials Sciences
language:en
Short-container-title:Critical Reviews in Solid State and Materials Sciences

Author:

Izyumskaya N.¹,Alivov Y.-I.¹,Cho S.-J.¹,Morkoç H.¹,Lee H.²,Kang Y.-S.³

Affiliation:

1. a Department of Electrical and Computer Engineering and Department of Physics , Virginia Commonwealth University , Richmond, VA, 23284-3068, USA

2. b Department of Physics and Applied Physics , Kyung Hee University , Kyung-Ki-Do, 5 Yong-In, 449-701, S. Korea

3. c Samsung Advanced Institute of Technology (SAIT) , 14 Nong-Seo Ri, Youn-In City, Gyung-Gee Do, Republic of Korea

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,General Chemical Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10408430701707347

Reference534 articles.

1. Jaffe , B. Cook , W. R. Jr. and Jaffe , H. 1971.Piezoelectric Ceramics, 131London: Academic Press.

2. Total-dose radiation effects on sol-gel derived PZT thin films

3. Radiation effects on ferroelectric thin‐film memories: Retention failure mechanisms

4. Enhanced-response pyroelectric heterostructures

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