Compositional depth profiling by auger electron spectroscopy-Reference-Cited by-同舟云学术

Compositional depth profiling by auger electron spectroscopy

Published:1978-12 Issue:1 Volume:8 Page:53-67
ISSN:1040-8436
Container-title:Critical Reviews in Solid State and Materials Sciences
language:en
Short-container-title:Critical Reviews in Solid State and Materials Sciences

Author:

Hall P. M.,Morabito J. M.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,General Chemical Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/10408437808243617

Reference50 articles.

1. MacDonald, N. C. and Hovland, C. T. 1977. The scanning Auger microprobe: a review, in 8th Int. Conf. X-Ray Optics and Microanalysis and 12th Conf. Microbeam Analysis Society. August18 to 241977, Boston. pp.64

2. Techniques for elemental composition profiling in thin films

3. Sputtering in the surface analysis of solids: A discussion of some problems

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