Heavy-ion and pulsed laser induced single-event double transients in nanometer inverter chain-Reference-Cited by-同舟云学术

Heavy-ion and pulsed laser induced single-event double transients in nanometer inverter chain

Published:2022-12-22 Issue: Volume: Page:1-13
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Zhao Wen¹^ORCID,Chen Wei¹,He Chaohui²,Chen Rongmei³,Zhang Fengqi¹,Guo Xiaoqiang¹,Lu Chao⁴,Shen Chen⁵

Affiliation:

1. The State Key Laboratory of Intense Pulsed Radiation Simulation and Effect (Northwest Institute of Nuclear Technology), Xi’an, People’s Republic of China

2. The School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an, People’s Republic of China

3. IMEC, Leuven, Belgium

4. The department of Engineering Physics, Tsinghua University, Beijing, People’s Republic of China

5. Cogenda Co Ltd., Suzhou, People’s Republic of China

Funder

Major Program of National Natural Science Foundation of China

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

https://www.tandfonline.com/doi/pdf/10.1080/10420150.2022.2148250

Reference19 articles.

1. Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

2. Evans A.; Glorieux M.; Alexandrescu D.; Polo C. B.; Cavrois V. F. Single Event Multiple Transients (SEMT) Measurements in 65 nm Bulk Technology. Proceedings of Radiation and Its Effects on Components and Systems, Bremen, Germany, Sept 19–23, 2016.

3. Harada R.; Mitsuyama Y.; Hashimoto M.; Onoye T. Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing. Proceedings of IEEE International Reliability Physics Symposium, Monterey, CA, USA, Apr 10–14, 2011.

4. Ahlbin J. R.; Loveless T. D.; Ball D. R.; Bhuva B. L.; Witulski A. F.; Massengill L.W.; Gadlage M. J. Double-Pulse-Single-Event Transients in Combinational Logic. Proceedings of IEEE International Reliability Physics Symposium, Monterey, CA, USA, Apr 10–14, 2011.

5. Heavy-Ion-Induced Charge Sharing Measurement With a Novel Uniform Vertical Inverter Chains (UniVIC) SEMT Test Structure

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