Simulation test technique for nuclear and space radiation effects

Author:

CHEN Wei,LUO Yin-Hong,MA Wu-Ying,WANG Chen-Hui,DING Li-Li,WANG ZuJun,LIU Yan,MEI Bo,YAO Chong-Bin,ZENG Chao,GUO Xiao-Qiang,WANG Zhong-Ming,WU Wei

Publisher

Science China Press., Co. Ltd.

Reference84 articles.

1. Chen P X. Radiation Effects on Semiconductor Devices and Integrated Circuits (in Chinese). Beijing: National Defense Industry Press, 2005 [陈盘训. 半导体器件和集成电路的辐射效应. 北京: 国防工业出版社, 2005].

2. Lai Z W. Radiation Electronics: Radiation Effect and Reinforce Technology (in Chinese). Beijing: National Defense Industry Press, 1998 [赖祖武. 抗辐射电子学: 辐射效应及加固技术. 北京: 国防工业出版社, 1998].

3. Zhang Y L, Chen X Q, Yan Y, et al. The Space Environment and Its Effects on Space Systems (in Chinese). Beijing: China Astronautic Publishing House, 2011 [张育林, 陈小前, 闫野, 等. 空间环境及其对航天器的影响. 北京: 中国宇航出版社, 2011].

4. Chen W, Yang H L, Guo X Q. The research status and challenge of space radiation physics and application (in Chinese). Chin Sci Bull, 2017, 62: 978-989.

5. Chen W, Liu J, Ma X H. Research progress of radiation effects mechanisms and experimental techniques in nano-devices (in Chinese). Chin Sci Bull, 2018, 63: 1211-1222.

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