Transmission electron microscopy of extended crystal defects in proton bombarded and annealed gaas
Author:
Publisher
Informa UK Limited
Subject
General Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00337578308217824
Reference37 articles.
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2. Electrical profiling and optical activation studies of Be‐implanted GaAs
3. Cross‐sectional specimens for transmission electron microscopy
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