Degradation model analysis of two-component series and parallel systems
Author:
Affiliation:
1. College of Construction Engineering, Jilin University, Changchun, People's Republic of China
2. College of Mechanical Engineering, Jilin University, Changchun, People's Republic of China
Funder
National Natural Science Foundation of China
Publisher
Informa UK Limited
Subject
Applied Mathematics,Statistics, Probability and Uncertainty,Modelling and Simulation,Statistics and Probability
Link
https://www.tandfonline.com/doi/pdf/10.1080/00949655.2017.1335732
Reference24 articles.
1. Analysis of Performance-Degradation Data from Accelerated Tests
2. Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
3. Gauss–Poisson Joint Distribution Model for Degradation Failure
4. Reliability assessment of the metallized film capacitors from degradation data
5. A Hierarchical Model for Lithium-Ion Battery Degradation Prediction
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