Active dopant characterization methodology for germanium-Reference-Cited by-同舟云学术

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Active dopant characterization methodology for germanium

Published:2006 Issue:1 Volume:24 Page:381
ISSN:1071-1023
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Clarysse T.,Eyben P.,Janssens T.,Hoflijk I.,Vanhaeren D.,Satta A.,Meuris M.,Vandervorst W.,Bogdanowicz J.,Raskin G.

Publisher

American Vacuum Society

Subject

Electrical and Electronic Engineering,Condensed Matter Physics

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of Lithium Diffusion Coefficients in Single Battery Active Material Particles by Using an AFM-Based Steady-State Diffusion Depolarization Technique;The Journal of Physical Chemistry C;2021-01-15

2. Macroscopic Versus Microscopic Schottky Barrier Determination at (Au/Pt)/Ge(100): Interfacial Local Modulation;ACS Applied Materials & Interfaces;2020-06-02

3. Quantitative scanning spreading resistance microscopy on n-type dopant diffusion profiles in germanium and the origin of dopant deactivation;Journal of Applied Physics;2019-02-28

4. Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures;Electrical Atomic Force Microscopy for Nanoelectronics;2019

5. Fundamentals of CAFM Operation Modes;Conductive Atomic Force Microscopy;2017-08-16

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