Fundamentals of CAFM Operation Modes-Reference-Cited by-同舟云学术

Fundamentals of CAFM Operation Modes

Published:2017-08-16 Issue: Volume: Page:45-77
ISSN:
Container-title:Conductive Atomic Force Microscopy
language:
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Author:

Benstetter Guenther¹,Hofer Alexander¹,Liu Donping²,Frammelsberger Werner³,Lanza Mario⁴

Affiliation:

1. Deggendorf Institute of Technology, Faculty of Electrical; Media and Computer Engineering; Dieter-Görlitz-Platz 1, 94469 Deggendorf Germany

2. Dalian Nationalities University; School of Physics and Materials Engineering; No. 18, Liaohe West Road, Dalian, Development Zone, Dalian 116600 China

3. Deggendorf Institute of Technology; Faculty of Mechanical Engineering and Mechatronics; Dieter-Görlitz-Platz 1, 94469 Deggendorf Germany

4. Soochow University, Institute of Functional Nano & Soft Materials; 199 Ren-Ai Road, Bld. 909; Office 3215 Suzhou 215123 China

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527699773.ch3/fullpdf

Reference95 articles.

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2. Olbrich , A. Ebersberger , B. Boit , C. 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual, Reno, NV, USA 163 168

3. High resolution Fowler-Nordheim field emission maps of thin silicon oxide layers;Ruskell;Appl. Phys. Lett.,1996

4. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy;Murrell;Appl. Phys. Lett.,1993

5. Characterization of tips for conducting atomic force microscopy;O'Shea;Rev. Sci. Instrum.,1995

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