Low-temperature synthesis of crystalline vanadium oxide films using oxygen plasmas

Author:

Mohammad Adnan1ORCID,Joshi Krishna D.2ORCID,Rana Dhan2ORCID,Ilhom Saidjafarzoda1,Wells Barrett2ORCID,Willis Brian3ORCID,Sinkovic Boris2,Okyay A. K.45ORCID,Biyikli Necmi1ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Connecticut 1 , Storrs, Connecticut 06269

2. Department of Physics, University of Connecticut 2 , Storrs, Connecticut 06269

3. Department of Chemical and Biomolecular Engineering, University of Connecticut 3 , Storrs, Connecticut 06269

4. Department of Electrical Engineering, Stanford University 4 , Stanford, California 94305

5. OkyayTechALD LLC 5 , Ankara 06374, Turkey

Abstract

Vanadium oxide (VOx) compounds feature various polymorphs, including V2O5 and VO2, with attractive temperature-tunable optical and electrical properties. However, to achieve the desired material property, high-temperature post-deposition annealing of as-grown VOx films is mostly needed, limiting its use for low-temperature compatible substrates and processes. Herein, we report on the low-temperature hollow-cathode plasma-enhanced atomic layer deposition (ALD) of crystalline vanadium oxide thin films using tetrakis(ethylmethylamido)vanadium and oxygen plasma as a precursor and coreactant, respectively. To extract the impact of the type of plasma source, VOx samples were also synthesized in an inductively coupled plasma-enhanced ALD reactor. Moreover, we have incorporated in situ Ar-plasma and ex situ thermal annealing to investigate the tunability of VOx structural properties. Our findings confirm that both plasma-ALD techniques were able to synthesize as-grown polycrystalline V2O5 films at 150 °C. Postdeposition thermal annealing converted the as-grown V2O5 films into different crystalline VOx states: V2O3, V4O9, and VO2. The last one, VO2 is particularly interesting as a phase-change material, and the metal-insulator transition around 70 °C has been confirmed using temperature-dependent x-ray diffraction and resistivity measurements.

Funder

University of Connecticut, Startup Research Funding

Research Excellence Program

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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