Diffraction-assisted extreme ultraviolet proximity lithography for fabrication of nanophotonic arrays

Author:

Danylyuk Serhiy,Kim Hyun-su,Brose Sascha,Dittberner Carsten,Loosen Peter,Taubner Thomas,Bergmann Klaus,Juschkin Larissa

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Design and realization of an in-lab EUV dual beamline for industrial and scientific applications;International Conference on Extreme Ultraviolet Lithography 2021;2021-10-13

2. Design and realization of an industrial stand-alone EUV resist qualification setup;Extreme Ultraviolet Lithography 2020;2020-10-13

3. Computational proximity lithography with extreme ultraviolet radiation;Optics Express;2020-08-28

4. Computer simulation of diffraction focusing in proximity lithography;SECOND INTERNATIONAL CONFERENCE ON MATERIAL SCIENCE, SMART STRUCTURES AND APPLICATIONS: ICMSS-2019;2019

5. Holographic masks for computational proximity lithography with EUV radiation;International Conference on Extreme Ultraviolet Lithography 2018;2018-10-03

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