Intrinsic secondary ion emission from binary alloys during Ar+ bombardment
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Published:1981-03
Issue:2
Volume:18
Page:570-573
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ISSN:0022-5355
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Container-title:Journal of Vacuum Science and Technology
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language:en
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Short-container-title:Journal of Vacuum Science and Technology
Author:
Yu M. L.,Reuter W.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
9 articles.
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1. Sputtering and secondary ion emission from Cu/Ni(100);Surface Science;2001-05
2. Charged and excited states of sputtered atoms;Topics in Applied Physics;1991
3. Sekundär-Ionen-Massenspektrometrie (SIMS);Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
4. A comparison of secondary ion and photon yields from ion bombarded CuNi alloys;Surface Science;1984-04
5. Secondary Ion Mass Spectrometry;Condensed Matter;1983