Sputtering and secondary ion emission from Cu/Ni(100)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference68 articles.
1. Secondary Ion Mass Spectrometry,1987
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5. Sputtering of atoms in fine structure states: a probe of excitation and de-excitation events
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1. Monolayer bimetallic surfaces: Experimental and theoretical studies of trends in electronic and chemical properties;Surface Science Reports;2008-05
2. Molecular dynamics simulations of the initial stages of sputter erosion of a metal overlayer system: 2keV Ar→Cu/Ni(100);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-01
3. Secondary-ion emission from III-V semiconductive materials under MeV-energy heavy-ion bombardment;Physical Review A;2004-10-29
4. Classical dynamics simulation of the fluence dependence of sputtering properties for the 2 keV Cu→Cu(100) system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-09
5. CHARACTERIZATION OF Al+ SECONDARY ION EMISSION PRODUCED BY Ne+ AND Ar+ BOMBARDMENT OF ALUMINIUM SURFACE;Surface Review and Letters;2004-08
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