NiO/β-(AlxGa1−x)2O3/Ga2O3 heterojunction lateral rectifiers with reverse breakdown voltage >7 kV

Author:

Wan Hsiao-Hsuan1ORCID,Li Jian-Sian1ORCID,Chiang Chao-Ching1ORCID,Xia Xinyi1ORCID,Ren Fan1ORCID,Masten Hannah N.2ORCID,Lundh James Spencer2ORCID,Spencer Joseph A.23ORCID,Alema Fikadu4ORCID,Osinsky Andrei4,Jacobs Alan G.2ORCID,Hobart Karl2ORCID,Tadjer Marko J.2ORCID,Pearton S. J.5ORCID

Affiliation:

1. Department of Chemical Engineering, University of Florida 1 , Gainesville, Florida 32611

2. U.S. Naval Research Laboratory 2 , Washington, DC 20375

3. Virginia Tech 3 , Blacksburg, Virginia 24060

4. Agnitron Technology, Inc. 4 , Chanhassen, Minnesota 55317

5. Department of Materials Science and Engineering, University of Florida 5 , Gainesville, Florida 32611

Abstract

NiO/β-(AlxGa1−x)2O3/Ga2O3 heterojunction lateral geometry rectifiers with diameter 50–100 μm exhibited maximum reverse breakdown voltages >7 kV, showing the advantage of increasing the bandgap using the β-(AlxGa1−x)2O3 alloy. This Si-doped alloy layer was grown by metal organic chemical vapor deposition with an Al composition of ∼21%. On-state resistances were in the range of 50–2180 Ω cm2, leading to power figures-of-merit up to 0.72 MW cm−2. The forward turn-on voltage was in the range of 2.3–2.5 V, with maximum on/off ratios >700 when switching from 5 V forward to reverse biases up to −100 V. Transmission line measurements showed the specific contact resistance was 0.12 Ω cm2. The breakdown voltage is among the highest reported for any lateral geometry Ga2O3-based rectifier.

Funder

Defense Threat Reduction Agency

National Science Foundation

Office of Naval Research

Air Force Office of Scientific Research

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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