Author:
Vemuri Rajitha N. P.,Hasin Muhammad R.,Alford T. L.
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
5 articles.
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1. Effect of carbon doping on threshold voltage and mobility of In-Si-O thin-film transistors;Journal of Vacuum Science & Technology B;2018-11
2. Reliability of Al2O3/In-Si-O-C Thin-Film Transistors with an Al2O3 Passivation Layer under Gate-Bias Stress;ECS Transactions;2018-07-23
3. Influence of Al2O3 layer insertion on the electrical properties of Ga-In-Zn-O thin-film transistors;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-11
4. Amorphous In-Ga-Zn-O thin-film transistors fabricated by microcontact printing;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-09
5. Improvement of negative-bias-illumination-stress stability in all-transparent double-gate InGaZnO thin-film transistors;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-03