Multi-staged deposition of trench-gate oxides for power MOSFETs
Author:
Affiliation:
1. Infineon Technologies Dresden GmbH, Koenigsbruecker Str. 180, 01099 Dresden, Germany
2. NaMLab gGmbH, Noethnitzer Str. 64, 01187 Dresden, Germany
3. Institute for Semiconductors and Microsystems, Noethnitzer Str. 64, 01187 Dresden, Germany
Publisher
American Vacuum Society
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://avs.scitation.org/doi/pdf/10.1116/1.5080527
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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