Measurement of ZnSe–GaAs(110) and ZnSe–Ge(110) heterojunction band discontinuities by x‐ray photoelectron spectroscopy (XPS)-Reference-Cited by-同舟云学术

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Measurement of ZnSe–GaAs(110) and ZnSe–Ge(110) heterojunction band discontinuities by x‐ray photoelectron spectroscopy (XPS)

Published:1982-07 Issue:2 Volume:21 Page:482-485
ISSN:0022-5355
Container-title:Journal of Vacuum Science and Technology
language:en
Short-container-title:Journal of Vacuum Science and Technology

Author:

Kowalczyk Steven P.,Kraut E. A.,Waldrop J. R.,Grant R. W.

Publisher

American Vacuum Society

Subject

General Engineering

Link

http://avs.scitation.org/doi/pdf/10.1116/1.571684

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