Characterization of (Hg,Cd)Te by the photoconductive decay technique-Reference-Cited by-同舟云学术

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Characterization of (Hg,Cd)Te by the photoconductive decay technique

Published:1990-03 Issue:2 Volume:8 Page:1167-1170
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Lopes V. C.,Wright W. H.,Syllaios A. J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.576937

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Long operating lifetime mid-infrared LEDs based on black phosphorus;Nature Communications;2023-08-10

2. Calculation of Minority Carriers’ Lifetime in HgCdTe Structures by Using the Method Based on Mutual Correlation Between the Concentration of Electrical Particles;IEEE Transactions on Electron Devices;2022-04

3. Minority carrier lifetime in iodine-doped molecular beam epitaxy-grown HgCdTe;Applied Physics Letters;2015-11-02

4. Advanced thin conformal Al2O3 films for high aspect ratio mercury cadmium telluride sensors;Optical Engineering;2012-10-03

5. The bulk generation-recombination processes and the carrier lifetime in mid-wave infrared and long-wave infrared liquid nitrogen cooled HgCdTe alloys;Journal of Applied Physics;2012-08

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