Effects of plasma shield plate design on epitaxial GaN films grown for large-sized wafers in radical-enhanced metalorganic chemical vapor deposition
Author:
Affiliation:
1. Toshiba Electronic Devices and Storage Corporation, Nomi-shi, Ishikawa 923-1293, Japan
2. Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8601, Japan
Funder
New Energy and Industrial Technology Development Organization
Publisher
American Vacuum Society
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://avs.scitation.org/doi/pdf/10.1116/1.5083970
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Epitaxial growth of high-quality GaN with a high growth rate at low temperatures by radical-enhanced metalorganic chemical vapor deposition;Scientific Reports;2024-05-13
2. Perspectives on functional nitrogen science and plasma-based in situ functionalization;Japanese Journal of Applied Physics;2021-12-15
3. Novel Epitaxy for Nitride Semiconductors Using Plasma Technology;physica status solidi (a);2020-11-12
4. Simulation-aided design of very-high-frequency excited nitrogen plasma confinement using a shield plate;Journal of Vacuum Science & Technology B;2019-11
5. Giant Stability Enhancement of CsPbX3 Nanocrystal Films by Plasma-Induced Ligand Polymerization;ACS Applied Materials & Interfaces;2019-09-03
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