Measurement of semiconductor–insulator interface states by constant‐capacitance deep‐level transient spectroscopy
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Published:1982-07
Issue:2
Volume:21
Page:303-314
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ISSN:0022-5355
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Container-title:Journal of Vacuum Science and Technology
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language:en
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Short-container-title:Journal of Vacuum Science and Technology
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
130 articles.
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