Scanning tunneling spectroscopy of field-induced Au nanodots on ultrathin oxides on Si(100)-Reference-Cited by-同舟云学术

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Scanning tunneling spectroscopy of field-induced Au nanodots on ultrathin oxides on Si(100)

Published:2001 Issue:2 Volume:19 Page:523
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Park Jeong Young,Phaneuf R. J.,Williams E. D.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Origin of negative differential resistance in molecular junctions of Rose Bengal;Applied Physics Letters;2007-01-08

2. In situfabrication and characterization of tungsten nanodots on SiO2/Si via field induced nanocontact with a scanning tunnelling microscope;Nanotechnology;2005-10-28

3. Scanning-probe-induced defects in thinSiO2film onSi: Comparison withSiclusters;Physical Review B;2004-08-13

4. Investigation of the direct electromigration term for Al nanodots within the depletion zone of a pn junction;Journal of Applied Physics;2003-11-15

5. Polarity dependence in pulsed scanning tunneling microscopy fabrication and modification of metal nanodots on silicon;Journal of Applied Physics;2002-08-15

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