Investigation of the direct electromigration term for Al nanodots within the depletion zone of a pn junction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1619193
Reference14 articles.
1. Al2Cu precipitate distribution in AlCu interconnects after electromigration stressing: A study by Auger microscopy and ion beam bevelling
2. Electromigration on semiconductor surfaces
3. Electromigration kinetics of gold on a carbon thin film surface studied by scanning tunneling microscopy and scanning tunneling potentiometry
4. Scanning probe microscopy studies of electromigration in electroplated Au wires
5. In situscanning-tunneling-microscopy studies of early-stage electromigration in Ag
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1. In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires;Journal of Nanoscience and Nanotechnology;2012-11-01
2. Scanning tunneling spectroscopy under large current flow through the sample;Review of Scientific Instruments;2011-07
3. Electrostatic-directed deposition of nanoparticles on a field generating substrate;Nanotechnology;2005-07-22
4. Direct measurement of forces during scanning tunneling microscopy imaging of silicon pn junctions;Applied Physics Letters;2005-04-25
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