In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires
-
Published:2012-11-01
Issue:11
Volume:12
Page:8741-8745
-
ISSN:1533-4880
-
Container-title:Journal of Nanoscience and Nanotechnology
-
language:en
-
Short-container-title:j nanosci nanotechnol
Author:
Murakami Yosuke,Arita Masashi,Hamada Kouichi,Takahashi Yasuo
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering