Defect Analysis in Memory Unit
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-0275-7_44
Reference25 articles.
1. Li Y, Quader KN (2013) NAND flash memory: challenges and opportunities. Computer 46(8):23–29. https://doi.org/10.1109/MC.2013.190
2. Monzio Compagnoni C, Spinelli AS (2019) Reliability of NAND flash arrays: a review of what the 2-D–to–3-D transition meant. IEEE Trans Electron Dev 66(11):4504–4516. 10.1109/ted.2019.2917785
3. Mielke NR, Frickey RE, Kalastirsky I, Quan M, Ustinov D, Vasudevan VJ (2017) Reliability of solid-state drives based on NAND flash memory. Proc IEEE 105(9):1725–1750. https://doi.org/10.1109/JPROC.2017.2725738
4. Cai Y, Ghose S, Haratsch EF, Luo Y, Mutlu O (2017) Error characterization, mitigation, and recovery in flash-memory-based solid-state drives. Proc IEEE 105(9):1666–1704. https://doi.org/10.1109/JPROC.2017.2713127
5. Zambelli C, Micheloni R, Olivo P (2019) Reliability challenges in 3D NAND flash memories. In: 2019 IEEE 11th International Memory Workshop (IMW), Monterey, CA, USA, pp 1–4. 10.1109/IMW.2019.8739741
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1. Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
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