Author:
Gokkul Nath T. S.,Midhila E. R.,Swaminathan Ashwin,Lekshmi Binitaa,Anita J. P.
Reference15 articles.
1. Jha, N., Gupta, S.: Testing of Digital Systems. Cambridge University Press, Cambridge (2003)
2. Aitken, R.C.: Modeling the unmodelable: algorithmic fault diagnosis. IEEE Des. Test Comput. 14(3), 98–103 (1997)
3. Huisman, L.M.: Diagnosing arbitrary defects in logic designs using single location at a time (SLAT). IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 23(1), 91–101 (2004)
4. Lin, Y.C., Lu, F., Cheng, K.-T.: Multiple-fault diagnosis based on adaptive diagnostic test pattern generation. IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 26(5), 932–942 (2007)
5. Lavo, D., Hartanto, I., Larrabee, T.: Multiplets, models, and the search for meaning: improving per-test fault diagnosis. In: Proceedings of International Test Conference, pp. 250–259, January 2002