Publisher
Springer Nature Singapore
Reference28 articles.
1. Badenius D (1991) New definitions of basic R & M terms. Microelectron Reliab 31:525–535
2. Chandler JA (1977) X-ray microanalysis in the electron microscope, volume 5 – part II. North Holland, Amsterdam
3. Devaney JR (1989) Materials aspect of electronic parts failures. SAMPE 21(1):22–26
4. Dummer GWA, Griffin NB (1962) Environmental testing techniques for electronics and materials. Pergamon Press, Oxford
5. Foucher B, Boullie J, Meslet B, Das D (2002) A review of reliability prediction methods for electronic devices. Microelectron Reliab 42:1155–1162