New definitions of basic R&M terms-Reference-Cited by-同舟云学术

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New definitions of basic R&M terms

Published:1991-01 Issue:2-3 Volume:31 Page:525-535
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Badenius Duncan

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Lectures on Functional Equations and Their Applications;Aczel,1966

2. Random Failure;Badenius;IEEE Transactions on Reliability,1970

3. Failure Rate/MTBF;Badenius;IEEE Transactions on Reliability,1970

4. Mathematical Methods of Reliability Theory;Gnedenko,1969

5. Mathematical Theory of Reliability;Barlow,1965

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliability Physics and Its Multidisciplinary Approach in the Development of Electrical and Electronic Products for Test and Measurement;Handbook of Quality System, Accreditation and Conformity Assessment;2024

2. Reliability Physics and Its Multidisciplinary Approach in the Development of Electrical and Electronic Products for Test and Measurement;Handbook of Quality System, Accreditation and Conformity Assessment;2023-11-28

3. Dependability, a key factor to the quality of products;International Journal of Quality & Reliability Management;1995-10

4. Note on MTBF versus mean-wear-life versus Mil-Hdbk-217;Microelectronics Reliability;1992-09

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