Author:
Farid Niveen,Mahmoud Naglaa,Nagib Nabil
Publisher
Springer Science and Business Media LLC
Subject
Atomic and Molecular Physics, and Optics
Reference18 articles.
1. F.L. McCrackin, E. Passaglia, R.R. Stromberg, H.L. Steinberg, Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry. J. Res. Natl. Bureau Stand. A Phys. Chem. 67A, 363–377 (1963)
2. R.M.A. Azzam, N.M. Bashara, Ellipsometry And Polarized Light (North Holland, Amsterdam, 1977)
3. N.N. Nagib, N.A. Mahmoud, L.Z. Ismail, M.A. Amer, K. Abd-El-Sabour, Effect of surface roughness on the optical constants of bulk polycrystalline gold samples. Optik 125, 1085–1087 (2014)
4. S.N. Svitasheva, Random phase mask as model of rough surface. Part I theory. Thin Solid Films 519, 2718–2721 (2011).
https://doi.org/10.1016/j.tsf.2010.11.070
5. M. Losurdo, A.S. Brown, G. Bruno, Graphene and Plasmonics: The Nanoscale Challenges for Real-time Spectroscopic Ellipsometry. E-MRS Fall Meeting, K-X-1:
www.european-mrs.com
(2012)
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献