Fault dictionary based switched current circuit fault diagnosis using entropy as a preprocessor
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/content/pdf/10.1007/s10470-010-9514-4.pdf
Reference14 articles.
1. Aminian, F., Aminian, M., & Collins, H. W., Jr. (2002). Analog fault diagnosis of actual circuits using neural networks. IEEE Transactions on Instrumentation and Measurement, 51(3), 544–550.
2. Aminian, M., & Aminian, F. (2000). Neural network based analog circuit fault diagnosis using wavelet transform as preprocessor. IEEE Transactions on Circuits and Systems II, Analog and Digital Signal Processing, 47(2), 151–156.
3. He, Y., & Sun, Y. (2001). A neural-based nonlinear L1-norm optimization approach for fault diagnosis of nonlinear circuits with tolerances. Proceeding Institute of Electrical Engineering—Circuits Devices Systems, 148(4), 223–228.
4. Sun, Y., & He, Y. (2008). Neural-network based approaches for analogue circuit fault diagnosis. In Y. Sun (Ed.), Test and diagnosis of analogue, mixed-signal and RF integrated circuits—the system on chip approach. London: Institute of Engineering and Technology. Ch. 3.
5. Yuan, L., He, Y., Huang, J., & Sun, Y. (2010). A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Transactions on Instrumentation and Measurement, 59(3), 586–595.
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1. Nonlinear Soft Fault Diagnosis of Analog Circuits Based on RCCA-SVM;IEEE Access;2020
2. A new switched current circuit fault diagnosis approach based on pseudorandom test and preprocess by using entropy and Haar wavelet transform;Analog Integrated Circuits and Signal Processing;2017-03-11
3. A new swarm-SVM-based fault diagnosis approach for switched current circuit by using kurtosis and entropy as a preprocessor;Analog Integrated Circuits and Signal Processing;2014-08-08
4. A Novel Fault Diagnostic Method Based on Node-Voltage Vector Ambiguity Sets;IEEE Transactions on Instrumentation and Measurement;2014-08
5. Analog fault diagnosis using S-transform preprocessor and a QNN classifier;Measurement;2013-08
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