Neural network-based L1-norm optimisation approach for fault diagnosis of nonlinear circuits with tolerance
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/ip-cds_20010418?crawler=true&mimetype=application/pdf
Reference26 articles.
1. Fault diagnosis of analog circuits
2. Liu, R.W., ‘Testing and diagnosis of analog circuits and systems’, (Van Nostrand and Reinhold 1991)
3. Ozawa, T., ‘Analog methods for computer-aided circuit analysis and diagnosis’, (Marcel Dekker, Inc. 1988)
4. A nonlinear<tex>l_1</tex>optimization algorithm for design, modeling, and diagnosis of networks
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