A new switched current circuit fault diagnosis approach based on pseudorandom test and preprocess by using entropy and Haar wavelet transform-Reference-Cited by-同舟云学术

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A new switched current circuit fault diagnosis approach based on pseudorandom test and preprocess by using entropy and Haar wavelet transform

Published:2017-03-11 Issue:3 Volume:91 Page:445-461
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Long Ying,Xiong Yuejun,He Yigang,Zhang Zhen

Funder

the National Natural Science Foundation of China

China Post-doctoral Science Foundation

Hunan Provincial Science and Technology Foundation of China

the Research Foundation of Education Bureau of Hunan Province

Changsha science and technology project of Hunan Provincial

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

http://link.springer.com/content/pdf/10.1007/s10470-017-0950-2.pdf

Reference28 articles.

1. Hughes, J. B., & Moulding, K. W. (1994). An 8 MHz, 80 Ms/s switched-current filter. In Solid-State Circuits Conference, 1994. Digest of Technical Papers. Isscc. 1994 IEEE International (pp. 60–61).

2. Aminian, F., Aminian, M., & Collins, H. W. (2002). Analog fault diagnosis of actual circuits using neural networks. IEEE Transactions on Instrumentation and Measurement, 51(3), 544–550.

3. Aminian, M., & Aminian, F. (2000). Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Transactions on Circuits & Systems II Analog & Digital Signal Processing, 47(2), 151–156.

4. Aminian, M., & Aminian, F. (2007). A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Transactions on Instrumentation and Measurement, 56(5), 1546–1554.

5. He, Y., & Sun, Y. (2001). Neural network-based l1-norm optimisation approach for fault diagnosis of nonlinear circuits with tolerance. IEE Proceedings Circuits, Devices and Systems, 148(4), 223–228.

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