Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors-Reference-Cited by-同舟云学术

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Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors

Published:2019-01-10 Issue:6 Volume:62 Page:
ISSN:1674-733X
Container-title:Science China Information Sciences
language:en
Short-container-title:Sci. China Inf. Sci.

Author:

Wang Zujun,Xue Yuanyuan,Chen Wei,Xu Rui,Ning Hao,He Baoping,Yao Zhibin,Liu Minbo,Sheng Jiangkun,Ma Wuying,Dong Guantao

Publisher

Springer Science and Business Media LLC

Subject

General Computer Science

Link

http://link.springer.com/content/pdf/10.1007/s11432-018-9554-4.pdf

Reference9 articles.

1. Xue Y Y, Wang Z J, Liu M B, et al. Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods. Sci China Inf Sci, 2017, 60: 120402

2. Eid E S, Chan T Y, Fossurn E R, et al. Design and characterization of ionizing radiation-tolerant CMOS APS image sensors up to 30 Mrd (Si) total dose. IEEE Trans Nucl Sci, 2001, 48: 1796–1806

3. Hopkinson G R. Radiation effects in a CMOS active pixel sensor. IEEE Trans Nucl Sci, 2000, 47: 2480–2484

4. Goiffon V, Magnan P, Saint-Pé O, et al. Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process. Nucl Instrum Meth Phys Res, 2009, 610: 225–229

5. Goiffon V, Estribeau M, Marcelot O, et al. Radiation effects in pinned photodiode CMOS image sensors: pixel performance degradation due to total ionizing dose. IEEE Trans Nucl Sci, 2012, 59: 2878–2887

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1. Degradation analysis of the pinned photodiode CMOS image sensors induced by energetic proton radiation;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-01

2. CMOS图像传感器质子位移损伤效应实验与分析;Acta Optica Sinica;2024

3. 不同偏置条件下CMOS图像传感器质子辐照损伤效应的实验与分析;Acta Optica Sinica;2023

4. Gamma Radiation Image Noise Prediction Method Based on Statistical Analysis and Random Walk;Sensors;2022-09-27

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