Comparison of single-event upset generated by heavy ion and pulsed laser
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Computer Science
Link
http://link.springer.com/content/pdf/10.1007/s11432-016-0346-1.pdf
Reference17 articles.
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3. Gaspard N J, Jagannathan S, Diggins Z J, et al. Technology scaling comparison of flip-flop heavy-ion single-event upset cross sections. IEEE Trans Nucl Sci, 2013, 60: 4368–4373
4. Buchner S P, Miller F, Pouget V, et al. Pulsed-laser testing for single-event effects investigations. IEEE Trans Nucl Sci, 2013, 60: 1852–1857
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