Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node-Reference-Cited by-同舟云学术

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Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

Published:2011-06 Issue:3 Volume:58 Page:1008-1014
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Loveless T D,Jagannathan S,Reece T,Chetia J,Bhuva B L,McCurdy M W,Massengill L W,Wen S-J,Wong R,Rennie D

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5875997/05742721.pdf?arnumber=5742721

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