Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous)
Reference26 articles.
1. K. Takamasu, Mesoscale Profile Measurement Improved by Intelligent Measurement Technology, Journal of JSPE, 74 2008, 213–216.
2. K. Takamasu, Macro, Meso and Nano Scale Dimensional Profile Measurement, Optical and Electro-Optical Engineering Contact, 49, 2011.
3. I. Misumi, S. Gonda, T. Kurosawa and K. Takamasu, Uncertainty in Pitch Measurements of One-Dimensional Grating Standards Using a Nanometrological Atomic Force Microscope, Meas. Sci. Technol., 14 (2003) 463–471.
4. I. Misumi, et al., Reliability of Parameters of Associated Base Straight Line in Step Height Samples: Uncertainty Evaluation in Step Height Measurements Using Nanometrological AFM, Precision Engineering, 30 (2006) 13–22.
5. ISO 3650, Geometrical Product Specification (GPS) — Length standards — Gauge blocks.
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献