Test generation algorithm for analog systems based on support vector machine

Author:

Long Ting,Wang Houjun,Long Bing

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Signal Processing

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optimisation of Test Stimulus for Analogue Circuits Based on the AOA;2024 IEEE 13th Data Driven Control and Learning Systems Conference (DDCLS);2024-05-17

2. Test Pattern Reduction Using Various ML Algorithms;2023 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER);2023-10-13

3. Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection;2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID);2023-01

4. Emoji-Integrated Polyseme Probabilistic Analysis Model: Sentiment Analysis of Short Review Texts on Library Service Quality;Traitement du Signal;2022-02-28

5. A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits;Journal of Electronic Testing;2020-12

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