Author:
Soma M.,Huynh S.,Zhang J.,Kim S.,Devarayanadurg G.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
29 articles.
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1. Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection;2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID);2023-01
2. Design and Simulation of a Self-Test Technique for High Frequency MEMS Actuators;2022 2nd International Conference on Advances in Engineering Science and Technology (AEST);2022-10-24
3. Automatic tool for test set generation and DfT assessment in analog circuits;Analog Integrated Circuits and Signal Processing;2022-05-10
4. A Versatile Test Set Generation Tool for Structural Analog Circuit Testing;2021 34th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2021-08-23
5. A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits;Journal of Electronic Testing;2020-12