A Versatile Test Set Generation Tool for Structural Analog Circuit Testing
Author:
Funder
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior - Brasil (CAPES)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9529954/9529346/09529987.pdf?arnumber=9529987
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Electronic Element Parameter Estimation of Amplifier Circuit using Regression Algorithms;2024 9th International Conference on Integrated Circuits, Design, and Verification (ICDV);2024-06-06
2. Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28
3. Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool;2022 IEEE 23rd Latin American Test Symposium (LATS);2022-09-05
4. Automatic tool for test set generation and DfT assessment in analog circuits;Analog Integrated Circuits and Signal Processing;2022-05-10
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