Automatic test generation algorithms for analogue circuits
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/ip-cds_19960898?crawler=true&mimetype=application/pdf
Reference59 articles.
1. On the Implementation of an Analog ATPG: The Linear Case
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3. Complex Field Fault Modeling-Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis;IEEE Transactions on Instrumentation and Measurement;2014-04
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