Benchmark Tests for MOSFET Compact Models
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-90-481-8614-3_3
Reference47 articles.
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4. Chen, Q., Wu, Z.Y., Su, R., Goo, J.S., Thuruthiyil, C., Radwin, M., Subba, N., Suryagandh, S., Ly, T., Wason, V., An, J., Icel, A.: Extraction of self-heating free I-V curves including the substrate current of PD SOI MOSFETs. In: Proc. IEEE Int. Conf. on Microelectron. Test Structures, pp. 272–275 (2007)
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