Introgression of the RppQ gene from field corn improves southern rust resistance in sweet corn

Abstract

AbstractSouthern rust, one of the most destructive foliar diseases of sweet corn (Zea mays convar. saccharata var. rugosa), is caused by Puccinia polysora Underw. and leads to enormous yield losses and reduced quality of sweet corn in China. Utilization of resistance genes is an effective and environmentally friendly strategy for improving southern rust resistance of sweet corn. However, improvement is hampered by a lack of resistance genes in Chinese sweet corn germplasm. In this study, we introgress the southern rust resistance gene RppQ from Qi319, an inbred line of southern rust–resistant field corn, into four elite sweet corn inbred lines (1401, 1413, 1434, and 1445) using marker-assisted backcross breeding. These are parental inbred lines of four popular sweet corn varieties: Yuetian 28, Yuetian 13, Yuetian 26, and Yuetian 27. We developed five RppQ-based markers (M0607, M0801, M0903, M3301, and M3402) and employed these markers for foreground selection; 92.3 to 97.9% of the recurrent parent genomes were recovered following three or four rounds of backcrossing. The four newly developed sweet corn lines all showed significant improvement of southern rust resistance compared with their respective parent lines. Meanwhile, there was no significant difference in phenotypic data for agronomic traits. In addition, reconstituted hybrids derived from the converted lines retained resistance to southern rust, while other agronomic traits and sugar content remained unchanged. Our study provides an example of successful development of southern rust–resistant sweet corn using a resistance gene from field corn.