Author:
An Sangmin,Sung Baekman,Noh Haneol,Stambaugh Corey,Kwon Soyoung,Lee Kunyoung,Kim Bongsu,Kim Qhwan,Jhe Wonho
Abstract
Abstract
In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane (PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization (force spectroscopy/microscopy) using the quartz tuning fork (QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Electronic, Optical and Magnetic Materials
Cited by
7 articles.
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