Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Cited by
12 articles.
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1. Two-channel X-ray reflectometer;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-06
2. Two-wave x-ray methods for characterization of supersmooth substrates and thin films;SPIE Proceedings;1999-11-16
3. New methods of X-ray reflectometry of solids and solid thin films;Journal of Russian Laser Research;1999-03
4. Characterization of TiO2 and ZrO2 coatings on silica slabs and fibres;Journal of Materials Science;1992-05
5. Properties of laser‐sputtered Ti/Be multilayers;Review of Scientific Instruments;1992-01