Two-channel X-ray reflectometer
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference5 articles.
1. X-ray investigations of supersmooth surfaces
2. Density measurements of thin germanium films by total reflection of X-rays
3. Monolayer behaviour of chiral compounds at the air-water interface: 4-hexadecyloxy-butane-1,2-diol
4. Measurement of Optical Coating Parameters;Komrakov,1986
5. A.G. Touryanski, Thesis, Moscow, 1981.
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