Characterization of thin film thickness and density by low angle X-ray interference
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference6 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Density Measurements of Some Thin Copper Films
3. Single Crystal Orienter Instruction Manual;Furnas,1957
4. Adaptation of an X‐Ray Diffractometer for Thin Film Studies by Total Reflection of X Rays
5. X‐Ray Reflection Studies of the Anneal and Oxidation of Some Thin Solid Films
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Application of Synchrotron X-Radiation to Problems in Materials Science;X-ray Characterization of Materials;2007-12-23
2. Application of Synchrotron X-Radiation to Problems in Materials Science;Materials Science and Technology;2006-09-15
3. Polar Polymeric Langmuir−Blodgett Films for Optical Applications;Macromolecules;1997-10-01
4. Characterisation of polyphenylene thin films using synchrotron radiation X-ray reflectivity;Journal of Physics D: Applied Physics;1990-02-14
5. Instrumentation for glancing angle x‐ray absorption spectroscopy on the Synchrotron Radiation Source;Review of Scientific Instruments;1989-07
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3