Investigation of local chemical and electronic properties of small particles with EELS point analysis and image energy filtering in a STEM-Reference-Cited by-同舟云学术

Investigation of local chemical and electronic properties of small particles with EELS point analysis and image energy filtering in a STEM

Published:1989-03 Issue:1-4 Volume:12 Page:333-339
ISSN:0178-7683
Container-title:Zeitschrift f�r Physik D Atoms, Molecules and Clusters
language:en
Short-container-title:Z Phys D - Atoms, Molecules and Clusters

Author:

Ugarte D.,Colliex C.

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics,Atomic and Molecular Physics, and Optics,Atomic and Molecular Physics, and Optics

Link

http://link.springer.com/content/pdf/10.1007/BF01426967.pdf

Reference34 articles.

1. Crewe, A.V.: In: Electron microscopy in material science. Valdre, U., Zichichi, A. (eds.), p. 162. New York: Academic Press 1971

2. Colliex, C., Mory, C.: In: Quantitative electron microscopy, Chapman, J.N., Craven, A.J. (eds.), pp. 149?216. Scottish Universities Summer School in Physics 1984

3. Cowley, J.M.: In: Catalytic materials: relationship between structure and reactivity. Whyte, T.E., Dalla Betta, R.A., Derouane, E.G., Baker, R.T.K. (eds.), pp. 353?366. American Chemical Society Symposium Series no 248 1984

4. Mory, C., Tenc�, M., Colliex, C.: J. Microsc. Spectrosc. Electron.10, 381 (1985)

5. Mory, C., Bonnet, N., Colliex, C., Kohl, H., Tenc�, M.: In: Image and signal processing in electron microscopy. Scanning Microscopy (Supplement)2, 329 (1988)

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